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The Testing & Application Center successfully achieved the CNAS authorization and got the CNAS laboratory accreditation certificate

The Testing & Application Center signed cooperation agreement for test project with Shenzhen Institute of Beijing University

The leaders of MIIT visited the Testing & Application Center

The engineers of Fairchild visited the Testing & Application Center to discuss the cooperation

Ms.Gengli, the professor of microelectronics department of telecommunications institute of Xi 'an Jiaotong university, visited the Testing & Application Center

The two engineers of the Testing & Application Center achieved internal auditor certificate of CNAS accredited laboratory

The audit team of the Testing & Application Center went to Guangzhou Sino-micro Electronics CO.,Ltd. for the process audit

The engineers of Strategic Resources Department and Quality Department of Salcomp (Shenzhen) Co., Ltd visited the Testing & Application Center

Dr. Li Chengzhan, the manager of new components research and development department of CSR Co., Ltd, visited the Testing & Application Center

Mr. Luo Jingtao, the senior engineer of the Testing & Application Center, visited several research institutes and university laboratories in Beijing to strengthen cooperation

 
Laboratory Development

The Testing & Application Center successfully achieved the CNAS authorization and got the CNAS laboratory accreditation certificate

 

August 10 to 11, 2012, the Xi’an Power Device Testing & Application Center successfully passed CNAS on-site audit, which included “laboratory quality documents compliance, the laboratory quality management system operation compliance, laboratory proficiency testing activity, etc”. The field test obtained satisfactory test results, and met the requests of on-site audit.
November 2, 2012, CNAS formally issued the laboratory accreditation certificate to the Testing & Application Center.
To achieved the CNAS authorization successfully means Testing & Application Center has the ability on independently inspecting power semiconductor chip and issuing an authority test report. It was also proved that the Center has the technical ability to offer testing service based on the relevant international standards. Meanwhile, the center qualified by ILAC-MRA and listed in the authorized institutions, It creates more chances to participate in international technology cooperation. And it further strengthens lab construction to enhance the testing capability and system management, promotes the Center offer better service with justice behavior, scientific method and accurate results to semiconductor industry customers. Therefore the center will help customers to reduce the risk of providing unqualified products and win the market.
Since November 2, 2012, the Xi’an Power Device Testing & Application Center will use the CNAS logo in testing reports within approved range. The test report will be recognized in 46 countries and regions, like getting an "international passport". To expend the both domestic and international influence of the Testing & Application Center, we will constantly optimize resources and strategy, set high level testing procedure to assure enterprise sustainable development and customer satisfaction.
The Xi’an Power Device Testing & Application Center will follow the quality policy to implement the testing standards and expend the testing scope. We will try our best to be a top lab in the field.
China National Accreditation Service for Conformity Assessment (CNAS) is approved and authorized by Certification and Accreditation Administration of the People’s Republic of China. It is responsible for the accreditation of certification agencies, laboratories, inspection agencies and other related institutions, according to relevant national laws and regulations and international standards. The testing report, issued by the organization achieved CNAS authorization not only has the force of law but also is recognized in international area.
 
 

Information

1. The Testing & Application Center signed cooperation agreement for test project with Shenzhen Institute of Beijing University

October 6, 2012, the Power Device Testing & Application Center signed cooperation agreement for test project with Shenzhen Institute of Beijing University. It agreed that the center will undertake testing and evaluation tasks of Shenzhen Institute of Beijing University in the latest project, the researching and development of new power device. The two sides both will keep long-term cooperation in the field of power device & power management IC research, charge and discharge technology, etc.

2. The leaders of MIIT visited the Testing & Application Center

October 16, 2012, Mr. Gaoqi, who is the chief marketing officer of IT service market of MIIT, and the deputy secretary general of Cina Sourcing Alliance arrived at the center for working guidance. Ms. Li Linfei who is the deputy general manager of Semipower, and Ms.Liu chen who is the director of the Testing & Application Center reported the center operation to them. R. Gao qi spoke highly of Center’s achievement of, serving local industry, actively introducing foreign advanced testing technology and experience, and coaching students of colleges and universities. He encouraged the center to continue working hard and achieve great success in promoting the enterprise independent innovation.

3. The engineers of Fairchild visited the Testing & Application Center to discuss the cooperation

October 18, 2012, , the senior test engineer Mr. Zeng Yuanzhou Mr. Zhou Haoran of APPE, Fairchild Semiconductor, (Suzhou) co., LTD. visited the Testing & Application Center, and discussed with laboratory engineers to learn the center operation management pattern. They looked forward to have a long-term technical communication and deeper cooperation.
Fairchild Semiconductor Co., LTD. is the leading supplier providing high performance power products for multiple terminal markets. It develops quality products to fit today and future electronic device needs for power minimization, transformation, distribution and management. Fairchild (Suzhou) mainly engaged in discrete power device packaging and testing. It provides thousands of products, which are widely used in microelectronics application fields, covering automobile, communication, computer, peripheral equipment, industry and consumer applications.

4. Ms.Gengli, the professor of microelectronics department of telecommunications institute of Xi 'an Jiaotong university, visited the Testing & Application Center

November 1, 2012, Ms. Gengli, the professor of microelectronics department of telecommunications institute of Xi 'an Jiaotong university, visited the Testing & Application Center laboratory, and learned the test ability of the laboratory for project cooperation in future. Professor Gengli has great attainments in power semiconductor device design and process area. During the visit, she highly appreciated the center’s efficient testing process.
 

5. The two engineers of the Testing & Application Center achieved internal auditor certificate of CNAS accredited laboratory

In order to meet the demands of the new development of the power device testing, further improve the test ability, and ensure the conformance of the testing operation with of the state and the international standards requirements, October 30 to November 2, 2012, Mr. Feng Haike, the quality supervisor, and Ms.Lvxiao, the quality engineer, participated in the internal auditors training organized by CNAS. After three days training, Mr. Feng Haike and Ms. Lvxiao passed the exam and achieved internal auditor certificate of CNAS accreditation laboratory They will attend the lab audit and improve the quality management system continuously.
 

6. The audit team of the Testing & Application Center went to Guangzhou Sino-micro Electronics CO.,Ltd. for the process audit

November 7, 2012, the audit team, which was composed of the director of the center Ms. LiuChen and the quality engineer Ms. Lvxiao, implemented the process audit in Guangzhou Sino-micro Electronics CO.,Ltd.. The main purpose of the audit was to check and verify the compliance, effectiveness and sustainability of the operation control, in the subcontractor production line.
The audit lasted three days. The auditors had a detailed on-site audit in GZSM. During the audit, auditors communicated with the QA, Engineering, R&D, Production departments about recently quality problem, quality objection, etc.. They reviewed the production line for audit findings, and evaluated the management system operation status. The audit report showed that “the management of GZSM pay attention to the quality management system improvement, regularly carry out management review and internal audit, it has a certain self improvement and self perfect continuous improvement mechanism, the quality system can meet mainly the demand of ISO and customers, Besides the report raised lots of improving suggestions.. Mr. Zhang Zewei, the deputy general manager of GZSM, thought highly of this audit, and hoped to be able to maintain a long-term cooperation.  

7. The engineers of Strategic Resources Department and Quality Department of Salcomp (Shenzhen) Co., Ltd visited the Testing & Application Center

November 19, 2012, Ms. Liu Yinxia and Ms. Wang Suping, represented the strategic resources department and quality department of Salcomp, visited the Testing & Application Center. They understood the test and analysis process from device to power supply products, witnessed the strict testing process in center. Mr. Feng Haike, the quality supervisor and reliability laboratory senior engineer, accompanied the visit. He introduced the lab may be a guard who protects products quality. The Testing & Application Center will monitor every step of the device production, from raw materials, packages process, final test, etc.. The center provides a powerful guarantee for Semipower product quality.
Salcomp (Shenzhen) Co., Ltd is a Finland wholly owned enterprise, committed to develop and provide the most innovative and green environmental charger products of mobile phone and other power solutions. The major customers cover the forefront of the mobile phone manufacturers, such as: NOKIA, SAMSUNG, SONY ERICSSON, SIEMENS, LG, etc. Its related chips of power supply products mainly use SAMWIN brand series.

8. Dr. Li Chengzhan, the manager of new components research and development department of CSR Co., Ltd, visited the Testing & Application Center

September 11, 2012, Mr. Xiao Xiangfeng, the secretary-general of Power Electronics Branch of China Electrical Equipment Industry Association, being accompanied by Mr. Luo Yi who is the president of Semipower, visited the Testing & Application Center for working guidance. He advised the specific requirements for the laboratory's development. He expressed that he would spare no effort to push the laboratory test ability to the leading domestic level.
November 14, 2012, Dr. Li Chengzhan, the manager of new components research and development and senior engineer of CSR Co., Ltd, visited the Testing & Application Center accompanied by Ms.Liu Chen. He gave high evaluation on laboratory complete equipments, operation and management system. Subsequently, he made a comparative test using the sample part and was satisfied with the test result. The main purpose of this trip of Dr. Li Chengzhan is to learn the lab’s facilities and test capabilities and then to build further cooperation in new device testing field.
CSR is mainly engaged in designing, manufacturing, selling, repairing and renting of railway locomotives, passenger cars, trucks, trains, subway vehicles, as well as the extend industry of railway transportation equipment technology. It offers technical services, information consulting and has industrial investment and management, import and export business and so on. CSR has the complete system of independent development, mass production, customer support in the field of railway locomotives, passenger cars, trucks, trains, subway vehicles and the related parts.

9. Mr. Luo Jingtao, the senior engineer of the Testing & Application Center, visited several research institutes and university laboratories in Beijing to strengthen cooperation

November 19 to 22, 2012, Mr. Luo Jingtao, the supervisor of device testing lab and senior engineer of the Testing & Application Center, visited the microelectronics institute of CAS, the 4th research institution of MIIT and Beijing University of Technology, to discuss the development of power device testing technology, and hoped to strengthen the cooperation on new test standard establish.

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